By Michael Greenwood, M.Sc.Aug 3 2023Reviewed by Megan Craig, M.Sc. Global Market ReportAtomic Force Microscopy Atomic force microscopy is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser diffraction.
Recent Developments in Atomic Force Microscopy Scanning tunneling microscopy is a related technique to AFM, wherein the tip of the probe is constructed from a conducting material, and the potential difference or current flow between tip and material, owing to the occurrence of quantum tunneling, used to infer information relating to electron density.
Quantum Technology eBook Compilation of the top interviews, articles, and news in the last year. Download a free copy Combining these microscopy techniques into a single platform allows an unprecedented level of nanomaterial characterization, potentially simultaneously describing both physical and electronic aspects of the sample. Revolutionary and high-end AFMs developed by Park Systems .
The industrial demand for AFM exceeds that of the entire academic and research demand, and this disparity is expected to grow further by 2031, as AFM and its variants become increasingly utilized in materials, electronics, and nanomaterial manufacture and quality control. Hard and rigid materials constructed from metals, polymers, and ceramics are particularly suited to characterization by AFM and associated techniques, and thus design towards the optimized analysis of these materials has and continues to be extensively explored. As discussed, soft matter such as living cells, biomolecules such as proteins and lipids, and dynamic and flexible polymers can also be assessed by AFM, though at this stage, with lesser resolution compared to rigid materials.
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